: Diskcon Japan 2010
You are cordially invited to Diskcon Japan 2010 at the Plaza Industry Ota (PiO) in Tokyo, Japan July 29th - 30th. Come visit Park Systems at Booth #4 and learn more about Park Systems’ industrial product line. Park Systems will be featuring a wide range of industrial AFM products for all aspects of in-line inspection of hard drive manufacturing, from automatic defect review to undercut and sidewall measurement. Learn about the XE-HDM, our automated industrial XE-series AFM, especially designed for hard disk media and substrate applications. With newly developed features of automatic defect review, the XE-HDM combines the superb performance of the XE-series AFM with the high throughput capability required by hard disk media manufacturers. Also, discover the XE-3DM, Park Systems’ new 3D AFM for high resolution sidewall imaging. With its unique and patented tilted Z-scan system, the XE-3DM is a breakthrough in imaging undercut and overhang structures at deep angles. Utilizing True Non-contact Mode, the XE-3DM can perform non-destructive measurement of soft photoresist surfaces 
July 28~
30, 2010
Micromachine/MEMS 2010
July 31~
Aug 4, 2010
NC – AFM 2010

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