: E-MRS Spring 2011
Park Systems, the preferred nanotechnology solutions partner for the most accurate AFM results, will exhibit at the E-MRS Spring 2011 Meeting, Nice, France from May 10th to 12th. Please come and visit our booth(#8) to learn our wide range of research AFM products. See an economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as all other systems in the XE product line. At the booth, we will also feature wide range of Park Systems’ AFM. Come and learn about our award-winning XE-100, which provides artifact-free imaging via Crosstalk Elimination (XE) and offers the ultimate in AFM resolution with True Non-Contact mode. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). All the XE-series of products feature artifact free imaging by Crosstalk Elimination (XE) and non-destructive scan by True Non-Contact mode.
http://www.emrs-strasbourg.com/index.php?option=com_content&task=view&id=96&Itemid=132
Apr 25~
29, 2011
MRS Spring 2011
July 12~
14, 2011
Semicon West 2011

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