: Diskcon USA 2010

You are cordially invited to Diskcon USA 2010 in Santa Clara, USA Sep. 9th - 10th. Come visit Park Systems (Booth 303) and learn more about our industrial product line. Park Systems will be featuring a wide range of industrial AFM products for all aspects of disk characterization, from automatic defect review to undercut and sidewall measurement. Learn about the XE-HDM, our automated industrial XE-series AFM, specially designed for hard disk media and substrate applications. With newly developed features designed for user convenience and safety, the XE-HDM combines the superb performance of the XE-series AFM with the high-throughput capability required by hard disk media manufacturers. Also, discover the XE-3DM, Park Systems’ new 3D AFM, utilizing True Non-Contact mode for the non-destructive sidewall roughness measurement of soft photoresist structures. With its unique tilt head capability, the XE-3DM is a breakthrough in high resolution 3D AFM measurements.

Sep 01~
03, 2010
JAIMA 2010
Sep 20~
22, 2010
Biophysical Society of Japan 48th Annual Meeting

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