: NC – AFM 2010
Park Systems cordially invites you to visit our booth (#9) at the 13th International Conference on Non-Contact Atomic Force Microscopy in Kanazawa Japan (July 31st to August 4th). Learn about our award-winning XE-100, which provides artifact-free imaging via Crosstalk Elimination (XE) and offers the ultimate in AFM resolution with True Non-Contact mode. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). 
http://www.afm.eei.eng.osaka-u.ac.jp/ncafm2010/
July 29~
30, 2010
Diskcon Japan 2010
Aug 17~
20, 2010
NanoKorea 2010

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