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  • Park AFM
    Nanomechanical Modes
    Easily measure the mechanical properties of your sample using our set of mechanical scanning modes.
    Each features Park System’s trademark accuracy so you always know
    you’re collecting data you can rely on.

Force-Distance Spectroscopy

Force Measurement of Tip-Sample Interaction

Force-Distance (Fd) curves is a spectroscopy technique measuring the vertical interaction between the tip and the sample surface while extending and retracting a Z scanner. Function of a cantilever deflection versus the extension of the piezoelectric scanner is he direct measurement of tip-sample interaction forces reflecting a mechanical property of surface.

force-distance-spectroscopy tip

(a) Force vs. distance curves in vacuum, (b) air (c) air with a contamination layer.

 
force-vs-distance
 

The various elastic properties that can be measured from Force vs. Distance curves.

Polymer on glass
Scan size: 10µm
Using Probe: NSC26CNSC36C
Imaged on a Park XE-Series using FD Spectroscopy mode.
 

Nanomechanical Modes