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  • Park AFM
    Nanomechanical Modes
    Easily measure the mechanical properties of your sample using our set of mechanical scanning modes.
    Each features Park System’s trademark accuracy so you always know
    you’re collecting data you can rely on.

Force Modulation Microscopy (FMM)

Force Amplitude and Phase Imaging of Sample Elasticity

Our FMM mode measures mechanical property variations over a sample’s surface. An AC modulation is applied to the cantilever while in contact with the sample surface, allowing you to monitor changes in amplitude and phase and gain insights into qualitative elastic and viscous responses.

Force-Modulation-Microscopy

The amplitude of cantilever deflection varies according to the mechanical properties of the sample surface.

 
crystal-facetts

[Topography] [FMM Phase]

Crystal Facetts
Scan size: 10µm
Using Probe: NSC36C
Imaged on a Park XE series using FMM.
 

Nanomechanical Modes