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Probe Store - Contact Mode

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
NSC36 0.95
1.75
0.6		 105
155
75		 Mikromasch ▪ Contact cantilever, Backside reflex coating
▪ 3 cantilevers on a chip		 Request Quote
.
Cantilever Data Cant. 1 Cant. 2 Cant. 3
Thickness /t ± 0.5, µm 1.0
Mean Width /w ± 3, µm 32.5
Length /l ± 5, µm 110 µm 90 µm 130 µm
Force Constant /(N/m) min 0.1 0.2 0.06
typ 1 2 0.6
max 4.6 9 2.7
Resonance Frequency /kHz min 30 45 25
typ 90 130 65
max 160 240 115
NSC36/HARD/AL BS 1
2
0.6		 90
130
65		 Mikromasch ▪ Contact cantilever, 3 cantilevers on a chip
▪ Hard Diamond-Like-Carbon coated probe tip		 Request Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
PNP-DB 0.48
0.03		 67
17		 Nanoworld ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 cantilevers on a chip		 Request Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 40 µm 40 µm
Length 100 µm 200 µm
Force Constant 0.48 N/m 0.06 N/m
Resonance Frequency 67 kHz 17 kHz
PPP-CONTSCR 0.2 23 Nanosensors ▪ Contact cantilever with higher Q factor ▪ Backside reflex coating Request Quote

The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Technical Data Nominal Value Specified Range
Thickness /µm 1 0.1-2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
PNP-TR 0.32
0.08		 67
17		 Nanoworld ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 triangular cantilevers on a chip		 Request Quote
Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 13.5 µm 28 µm
Length 100 µm 200 µm
Force Constant 0.32 N/m 0.08 N/m
Resonance Frequency 67 kHz 17 kHz
25Pt300B  18
(± 25%)		  20
(± 30%)		  Rocky Mountain Nanotechnology ▪ higher spring constant
▪ High resolution KPFM imaging		  Request Quote

The 25Pt300B is RMN’s most popular probe. Its higher spring constant is good for conductance measurements (C-AFM) and high resolution KPFM imaging. This versatile probe is a good choice for most applications.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /µm < 20  
12Pt400B  0.3
(± 40%)		  4.5
(± 30%)		  Rocky Mountain Nanotechnology ▪ Lowest spring constant
▪ Useful for contact AFM		  Request Quote

The 12Pt400B is RMN’s probe with the lowest spring constant. It is most useful for contact AFM measurements with minimum contact force (SCM and SMM). The 12Pt400A is the preferred probe for Agilent SMM applications.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 400 ± 15%
Cantilever width /µm 60 ± 15%
Spring constant /(N/m) 0.3 ± 40%
Frequency /kHz 4.5 ± 30%
Tip radius /µm < 20  
25Pt200B-H  250
(± 40%)		  100
(± 30%)		  Rocky Mountain Nanotechnology ▪ New high-spring constant RMN probe  Request Quote

The 25Pt200B-H is the new high-spring constant RMN probe. It is typically used for non-contact AFM measurements, tapping mode and KPFM, as well as c-AFM.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 200 ± 15%
Cantilever width /µm 50 ± 15%
Spring constant /(N/m) 250 ± 40%
Frequency /kHz 100 ± 30%
Tip radius /µm < 20  
 

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