Probe Store - Contact Mode
* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.
Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||||||||||||||||||||||||||||||
NSC36 | 0.95 1.75 0.6 |
105 155 75 |
Mikromasch | ▪ Contact cantilever, Backside reflex coating ▪ 3 cantilevers on a chip |
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NSC36/HARD/AL BS | 1 2 0.6 |
90 130 65 |
Mikromasch | ▪ Contact cantilever, 3 cantilevers on a chip ▪ Hard Diamond-Like-Carbon coated probe tip |
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PNP-DB | 0.48 0.03 |
67 17 |
Nanoworld | ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating ▪ 2 cantilevers on a chip |
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PPP-CONTSCR | 0.2 | 23 | Nanosensors | ▪ Contact cantilever with higher Q factor ▪ Backside reflex coating | Request Quote | ||||||||||||||||||||||||||||||||||||||||||||||
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
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PNP-TR | 0.32 0.08 |
67 17 |
Nanoworld | ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating ▪ 2 triangular cantilevers on a chip |
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25Pt300B | 18 (± 25%) |
20 (± 30%) |
Rocky Mountain Nanotechnology | ▪ higher spring constant ▪ High resolution KPFM imaging |
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The 25Pt300B is RMN’s most popular probe. Its higher spring constant is good for conductance measurements (C-AFM) and high resolution KPFM imaging. This versatile probe is a good choice for most applications.
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12Pt400B | 0.3 (± 40%) |
4.5 (± 30%) |
Rocky Mountain Nanotechnology | ▪ Lowest spring constant ▪ Useful for contact AFM |
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The 12Pt400B is RMN’s probe with the lowest spring constant. It is most useful for contact AFM measurements with minimum contact force (SCM and SMM). The 12Pt400A is the preferred probe for Agilent SMM applications.
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25Pt200B-H | 250 (± 40%) |
100 (± 30%) |
Rocky Mountain Nanotechnology | ▪ New high-spring constant RMN probe | Request Quote | ||||||||||||||||||||||||||||||||||||||||||||||
The 25Pt200B-H is the new high-spring constant RMN probe. It is typically used for non-contact AFM measurements, tapping mode and KPFM, as well as c-AFM.
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