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Probe Store - Contact Mode

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
NSC36 0.95
1.75
0.6
105
155
75
Mikromasch ▪ Contact cantilever, Backside reflex coating
▪ 3 cantilevers on a chip
Request Quote
.
Cantilever Data Cant. 1 Cant. 2 Cant. 3
Thickness /t ± 0.5, µm 1.0
Mean Width /w ± 3, µm 32.5
Length /l ± 5, µm 110 µm 90 µm 130 µm
Force Constant /(N/m) min 0.1 0.2 0.06
typ 1 2 0.6
max 4.6 9 2.7
Resonance Frequency /kHz min 30 45 25
typ 90 130 65
max 160 240 115
NSC36/HARD/AL BS 1
2
0.6
90
130
65
Mikromasch ▪ Contact cantilever, 3 cantilevers on a chip
▪ Hard Diamond-Like-Carbon coated probe tip
Request Quote
NSC36,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
PNP-DB 0.48
0.03
67
17
Nanoworld ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 cantilevers on a chip
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Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 40 µm 40 µm
Length 100 µm 200 µm
Force Constant 0.48 N/m 0.06 N/m
Resonance Frequency 67 kHz 17 kHz
PPP-CONTSCR 0.2 23 Nanosensors ▪ Contact cantilever with higher Q factor ▪ Backside reflex coating Request Quote

The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Technical Data Nominal Value Specified Range
Thickness /µm 1 0.1-2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
PNP-TR 0.32
0.08
67
17
Nanoworld ▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 triangular cantilevers on a chip
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Cantilever Data Cant. 1 Cant. 2
Thickness 0.5 µm 0.5 µm
Mean Width 13.5 µm 28 µm
Length 100 µm 200 µm
Force Constant 0.32 N/m 0.08 N/m
Resonance Frequency 67 kHz 17 kHz
25Pt300B  18
(± 25%)
 20
(± 30%)
 Rocky Mountain Nanotechnology ▪ higher spring constant
▪ High resolution KPFM imaging
 Request Quote

The 25Pt300B is RMN’s most popular probe. Its higher spring constant is good for conductance measurements (C-AFM) and high resolution KPFM imaging. This versatile probe is a good choice for most applications.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /µm < 20  
12Pt400B  0.3
(± 40%)
 4.5
(± 30%)
 Rocky Mountain Nanotechnology ▪ Lowest spring constant
▪ Useful for contact AFM
 Request Quote

The 12Pt400B is RMN’s probe with the lowest spring constant. It is most useful for contact AFM measurements with minimum contact force (SCM and SMM). The 12Pt400A is the preferred probe for Agilent SMM applications.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 400 ± 15%
Cantilever width /µm 60 ± 15%
Spring constant /(N/m) 0.3 ± 40%
Frequency /kHz 4.5 ± 30%
Tip radius /µm < 20  
25Pt200B-H  250
(± 40%)
 100
(± 30%)
 Rocky Mountain Nanotechnology ▪ New high-spring constant RMN probe  Request Quote

The 25Pt200B-H is the new high-spring constant RMN probe. It is typically used for non-contact AFM measurements, tapping mode and KPFM, as well as c-AFM.

Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 200 ± 15%
Cantilever width /µm 50 ± 15%
Spring constant /(N/m) 250 ± 40%
Frequency /kHz 100 ± 30%
Tip radius /µm < 20  

Probe Store - True Non Contact Mode

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-NCHR 42 330 Nanosensors ▪ Non-contact cantilever with high resonant frequency
▪ Backside reflex coating
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The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
SSS-NCHR 42 330 Nanosensors ▪ Non-contact cantilever with high resonant frequency, backside reflex coating
▪ Tip visibility from top
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Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
PPP-NCH 42 330 Nanosensors ▪ Non-contact cantilever with high resonant frequency Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
SSS-NCLR 48 190 Nanosensors ▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz
▪ Backside reflex coating
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Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
PPP-NCLR 48  190  Nanosensors  ▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz
▪ Backside reflex coating
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
PPP-NCL 48  190  Nanosensors ▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz Request Quote
 
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
SSS-NCL  48  190  Nanosensors ▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz
▪ Tip radius: 2 nm typical, < 5 nm max.
Request Quote
 
Technical Data Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 196
NSC15  40  325  Mikromasch ▪ Non-contact cantilever
▪ Backside reflex coating
 Request Quote

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM. 

Technical Data Nominal Value Specified Range
Thickness /µm 4 3.5 - 4.5
Mean Width /µm 30 27 - 33
Length /µm 125 120 - 130
Force Constant /(N/m) 40 20 - 80
Resonance Frequency /kHz 325 265 - 410
AR5-NCH  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR5-NCHR  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR5T-NCHR  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1, and the tip is tilted 13°.
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR10-NCH  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip
▪ Typical aspect ratio of the tip is 12:1
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR10-NCHR  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip
▪ Typical aspect ratio of the tip is 12:1
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
AR10T-NCHR  42  330  Nanosensors ▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 12:1, and the tip is tilted 13°
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
CNT-NCH  42  330  Nanosensors ▪ Noncontact cantilever with Carbon nanotube tip
▪ Length of the CNT tip: < 750 nm.
 Request Quote
Cantilever Data Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497
OMCL-AC160TS  26  300  Olympus ▪ Non-contact cantilever with high resonant frequency, backside reflex coating
▪ Tip visibility from top
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 3.7  
Mean Width /µm 40  
Length /µm 14  
Force Constant /(N/m) 26  
Resonance Frequency /kHz 300 200 - 400
ATEC-NC  45  335  Nanosensors ▪ Non-contact cantilever
▪ Tip visibility from top
 Request Quote

These tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever allowing it to be the only probe to offer real tip visibility from the top even if the probe is tilted.

Technical Data Nominal Value Specified Range
Thickness /µm 4.6 3.6 - 5.6
Mean Width /µm 45 40 - 50
Length /µm 160 150 - 170
Force Constant /(N/m) 45 12 - 110
Resonance Frequency /kHz 335 210 - 490
ACTA  40  300  AppNano ▪ Non-contact cantilever
▪ Backside reflex coating
 Request Quote
Technical Data Nominal Value Specified Range
Thickness /µm 4 3.5 - 4.5
Mean Width /µm 30 25 - 35
Length /µm 125 115 - 135
Force Constant /(N/m) 37 13 - 77
Resonance Frequency /kHz 300 200 - 400

Probe Store - LFM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-LFMR 0.2 23 Nanosensors ▪ Contact cantilever with higher sensitivity to lateral/frictional force
▪ Backside reflex coating
Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
OMCL-TR800PSA 0.38 
0.73 
0.05 
0.10
68 
71
18 
19
Olympus ▪ Contact cantilever for imaging soft biological samples
▪ Backside reflex coating
Request Quote

Probe Store - FMM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-FMR 2.8 75 Nanosensors ▪ Cantilever of optimized force constant for FMM
▪ Backside reflex coating
Request Quote

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM probe serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
DT-FMR 2.8 75 Nanosensors ▪ Cantilever of optimized force constant for FMM
▪ Diamond-coated tip, Backside reflex coating
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The DT-FMR probe is designed for force modulation microscopy. The force constant of this cantilever type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM probe serves also as a basis for magnetic coatings (MFM).Furthermore non-contact or tapping mode operation is possible with the FM sensor but with reduced operation stability.

For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 27.5 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 6.2 1.5 - 18.3
Resonance Frequency /kHz 105 65 - 155
NSC14/HARD/AL BS 5 160 Mikromasch ▪ Cantilever with lower force constant for FMM and Noncontact mode
▪ Hard Diamond-Like-Carbon coated probe tip
Request Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1

Probe Store - EFM/DC-EFM/SKPM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
NSC14/CR-AU 5 160 Mikromasch ▪ Cantilever with lower force constant for EFM
▪ Conductive tip for electrical application, Coated with Cr-Au
Request Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
PPP-NCSTAu 7.4 160 Nanosensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Au
Request Quote

NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

Property Nominal Value Specified Range
Thickness /µm 2.8 1.8 - 3.8
Mean Width /µm 27 19.5 - 34.5
Length /µm 150 140 - 160
Force Constant /(N/m) 7.4 1.2 - 29
Resonance Frequency /kHz 160 75 - 265
PPP-EFM 2.8 75 Nanosensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Pt-Ir
Request Quote

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
CDT-CONTR 0.2 13 Nanosensors ▪ Contact cantilever for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
CDT-NCHR 42 330 Nanosensors ▪ Cantilever with high resonant frequency for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip
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NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 80 23 - 225
Resonance Frequency /kHz 400 225 - 610
NSC36/CR-AU 0.95 
1.75 
0.6
105 
155 
75
 Mikromasch ▪ Contact cantilever for EFM, 3 cantilevers on a chip
▪ Conductive tip for electrical application, Coated with Cr-Au
 Request Quote
NSC36,
Cantilevers
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
Multi75E 3 75  Budget Sensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Cr-Pt
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Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

  value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
Platinum 18 14  - ▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Technical Data Nominal Value Specified Range
Width (µm) 100 90 - 110
Length(µm) 300 250 – 350
Force Constant(N/m) 18 10.8 -25.2
Resonance Frequency (kHz) 14 9.8 – 18.2
 

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Probe Store