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  • NX10-AFM
    革新的研究に最短の道程 Park NX10
  • SmartScan-AFM
    簡単&パワフルシンプルな3ステップの操作 Park SmartScan
  • NX20-AFM
    不良解析や大型試料を用いた研究に付加価値の高い選択肢l Park NX20
  • NX-wafer-AFM
    インラインのウエハ検査とメトロロジーの為の全自動AFM Park NX-Wafer
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Electrical and Other Sample Characterization Modes

  

Adaptable to any project

With a wide range of scanning modes and modular design, the Park NX20 has the power and flexibility you need for any project.

Surface Roughness Measurement

 • True Non-Contact Mode

 • Dynamic Force Mode

Electrical Characterization

 • Conductive AFM (ULCA and VECA)

 • Electric Force Microscopy (EFM)

 • Piezoelectric Force Microscopy (PFM)

 • Scanning Capacitance Microscopy (SCM)

 • Scanning Kelvin Probe Microscopy (SKPM)

 • Scanning Spreading Resistance Microscopy (SSRM)

 • Scanning Tunneling Microscopy (STM)

 • Time-Resolved Photo Current Mapping (Tr-PCM)

Mechanical Characterization

 • Force Modulation Microscopy (FMM)

 • Force-Distance (F-d) Spectroscopy

 • Force Volume Imaging

 • Lateral Force Microscopy (LFM)

 • Nanoindentation

 • Nanolithography

 • Phase Imaging

Electrical and Other Sample Characterization Modes

QuickStep SCM

The Fastest Scanning Capacitance Microscopy

PinPoint iAFM

The Frictionless Conductive AFM

Magnetic Force Microscopy (MFM)

Accurately view your sample’s magnetic structure

Scanning Thermal Microscopy (SThM)

Easily examine your sample’s thermal conductivity.

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Atomic Force Microscopy | AFM Microscope | Park Systems