概 >>
ڪΡ学
Ρ学
ーȫー

  Ρ学


ڪ変数関ܪȪーԪު続ƪުܪĪϰ体˪⡢ʫΫー檷Ī発̸ƪުAFM (Atomic Force Microscope顕ڰ)ϡΡ学Ρ学⪵ުުڪ学研ϼ対檷ӫꪹΪǪーƫૺϡ研ϼ۪䢪߾ءġުު・応īーɪꪷƪު

P-doped (red) and N-doped (blue) ...

Surface topography of ZnO film

Surface topography of ITO film


Ρ学ー

ーƫૺꪹAFMϡު̪ܪʫƫΫーĪƪ몳Ȫʥơ様˪ȪêƪŪ䪹窵ƪު様۪発تڪߪ籪ơーーーիŪ䪹AFMª驪労ڪ䪨ƪު

NX10
ΫΫーɫー׫ー˪AFM

XE-70
׫īǫ

XE-100
ު触ʫΫー寪AFM/SPMުΫѫիーޫ󫹪実ު롢ɫի㡢ѫƫë׫ɫѦΫիëëAFM

XE-120
ޫʪɡ学Ȫ対応ܪء学顕ڰΫȫëתȪԲAFM

XE-150
ݬ号ーѫƫë׫ɫѦAFM


温٫׫
温٪対応ʥ・ʿー

٫׫
߫Ȫ湿気Ѧꡣ

Ρ学対Բ

顕ڰȫޫ
իد/ի
単̿YIG (Yttrium Iron Garnetëȫꫦ鉄ーͫë)
د - ZnO
ʫϰΫѫー֪
Tr-PCM (Time-Resolved Photocurrent Mapping׵ޫëԫ)


Copyright © 2008 - Park Systems Corp. All Rights Reserved.
Contact usRegister | Home