AFM テクノロジー
クロストーク除去(XE)
完全非接触モードTM
真の試料トポグラフィーTM
アプリケーションノート
参照

   アプリケーションノート
生物科学
件名 ダウンロード
Live Cell Volume Measurement of ICM >>
ICM Image of Suspended Collagen Fibrils >>
Single Strand DNA Molecules >>
DNA Oligonucleotides >>
Embryonic Stem Cell >>
Phase Separation in the Co-Extruded Polymer >>
Mouse Sperm Cells >>
Liposomes and Vesicles >>
Lipid Vesicle and Bilayer >>
Human Astrocytoma Cells >>
AFM and Confocal Microscopy >>

材料科学
件名 ダウンロード
True Sample Topography Acquired by Low-Noise Z Position Sensor >>
Solar Cells >>
Patterned Arrays of Magnetic Nanostructures >>
Atomic Force Microscopy and Raman Spectroscopy >>
Quantum Dots/Photonic Devices >>
Critical Roughness Metrology >>
Single Crystal Yttrium Iron Garnet (YIG) >>
Nanoparticles/Nanotubes >>
Thin Films Nanolithography (XEL) >>
Graphene (Step Height) >>
Graphene Membrane/Graphite >>
Thin Film - ZnO >>
Characterization of Epitaxially Grown MnAs Films Using AFM and MFM >>
Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green Light Emitting Diode >>
Production and Measurement of Nanodot Array >>
Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments >>
Polymer Composite >>
Characterization of Organic Photovoltaic Cells >>
Phase Separation in the Co-Extruded Polymer >>
Green Chemical Polymer >>
Surface Morphology of Electrospun Fibers >>

データストレージ
件名 ダウンロード
High Throughput and Non-Destructive Sidewall Roughness Measurement Using 3-Dimensional AFM >>
True Sample Topography Acquired by Low-Noise Z Position Sensor >>
Critical Roughness Metrology >>
Undercut Structures and Sidewall Roughness >>
Etched Silicon Structures >>
AFM Metrology Considerations of Hard Disk Manufacturing >>
Programmable Data Density (PDD) for High Throughput Feature Measurement >>
New 3D-AFM for High Resolution Sidewall Imaging >>
Automatic Defect Review AFM for Hard Disk Media and Substrates >>
Patterned Arrays of Magnetic Nanostructures >>

半導体
件名 ダウンロード
High Throughput and Non-Destructive Sidewall Roughness Measurement Using 3-Dimensional AFM >>
True Sample Topography Acquired by Low-Noise Z Position Sensor >>
New 3-Dimensional AFM for CD Measurement and Sidewall Characterization >>
New 3D-AFM for High Resolution Sidewall Imaging >>
Etched Silicon Structures >>
Critical Roughness Metrology >>
Solar Cells >>
High Aspect Ratio Structure >>
Critical Dimension Measurement of High Aspect Ratio Trench with XE AFM >>
Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profiler >>

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